发明名称 |
Apparatus and method for the analysis of atomic and molecular elements by wavelength dispersive x-ray spectrometric devices |
摘要 |
In an apparatus and a method for the analysis of atomic or molecular elements contained in a sample by wavelength dispersive X-ray spectrometry, wherein primary x ray or electron radiation is directed onto the sample whereby fluorescence radiation is emitted from the sample, the fluorescence radiation is directed onto a mirror or focussing device consisting of a multi-layer structure including pairs of layers of which one layer of a pair consists of lanthanum and the other consists of carbon and the fluorescence radiation is reflected from the mirror or focussing device onto an analysis detector for the analysis of the atomic or molecular elements contained in the sample.
|
申请公布号 |
US2003026383(A1) |
申请公布日期 |
2003.02.06 |
申请号 |
US20020196806 |
申请日期 |
2002.07.17 |
申请人 |
MICHAELSEN CARSTEN;BORMANN RUDIGER;WIESMANN JORG |
发明人 |
MICHAELSEN CARSTEN;BORMANN RUDIGER;WIESMANN JORG |
分类号 |
G21K1/06;(IPC1-7):G01T1/36 |
主分类号 |
G21K1/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|