发明名称 Chemical mechanical polish pad conditioning device
摘要 A chemical mechanical polish pad conditioning device is disclosed. The device includes a conditioning substrate made of stainless steel forming a predetermined pattern on a surface. Also, a method of producing a chemical mechanical polish pad conditioning device is disclosed. The method includes providing a conditioning substrate made of stainless steel forming a predetermined pattern on a surface, and applying a hardening process to the surface of the conditioning substrate. The invention further discloses a method of conditioning a chemical mechanical polish pad. The method includes providing a conditioning substrate forming a predetermined pattern on a surface, fixing the conditioning substrate to a conditioning arm, and contacting the surface of the conditioning substrate with a polish pad and moving the conditioning substrate on the polish pad with a predetermined downforce at a predetermined rate of speed. Because the conditioning substrate does not use a diamond layer bonded to the substrate, there is no risk that detached diamonds may become embedded in the polish pad in the course of polishing. Under the configurations of the conditioning device, production of a custom conditioning device that meets specified cut-rate or surface roughness specifications can be achieved
申请公布号 US2003027504(A1) 申请公布日期 2003.02.06
申请号 US20020247152 申请日期 2002.09.19
申请人 SHIPLEY KEVIN D.;MESSER RICK;SPENCER WILLIAM H. 发明人 SHIPLEY KEVIN D.;MESSER RICK;SPENCER WILLIAM H.
分类号 B24B37/04;B24B53/007;B24B53/14;B24D18/00;(IPC1-7):B24B1/00 主分类号 B24B37/04
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