发明名称 SOI DEVICE HAVING TRENCH ISOLATION LAYER AND METHOD FOR FABRICATING THE SAME
摘要 PURPOSE: An SOI(Silicon On Insulator) device having a trench isolation layer and a method for fabricating the same are provided to reduce junction capacitance of the SOI device by forming a structure of a dual trench having two regions of different depth. CONSTITUTION: A semiconductor substrate(130) including a base layer(110), a buried oxide layer(115), and a semiconductor layer(120) is prepared. A trench(T) having the first region and the second region is formed to define an active region of the semiconductor layer(120). The depth of the first region is less than the thickness of the semiconductor layer(120). The depth of the second region is equal to the thickness of the semiconductor layer(120). An isolation layer(170) is formed by stacking an oxide layer liner(155), a nitride layer liner(160), and an insulating layer(165) on an inner wall and a bottom of the trench(T).
申请公布号 KR20030010429(A) 申请公布日期 2003.02.05
申请号 KR20010045693 申请日期 2001.07.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, BYEONG SEON;LEE, TAE JEONG;OH, MYEONG HWAN;PARK, SANG UK;SHIN, MYEONG SEON;YOO, SEUNG HAN
分类号 H01L21/76;H01L21/336;H01L21/762;H01L27/12;H01L29/786;(IPC1-7):H01L21/76 主分类号 H01L21/76
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