发明名称 |
SOI DEVICE HAVING TRENCH ISOLATION LAYER AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: An SOI(Silicon On Insulator) device having a trench isolation layer and a method for fabricating the same are provided to reduce junction capacitance of the SOI device by forming a structure of a dual trench having two regions of different depth. CONSTITUTION: A semiconductor substrate(130) including a base layer(110), a buried oxide layer(115), and a semiconductor layer(120) is prepared. A trench(T) having the first region and the second region is formed to define an active region of the semiconductor layer(120). The depth of the first region is less than the thickness of the semiconductor layer(120). The depth of the second region is equal to the thickness of the semiconductor layer(120). An isolation layer(170) is formed by stacking an oxide layer liner(155), a nitride layer liner(160), and an insulating layer(165) on an inner wall and a bottom of the trench(T).
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申请公布号 |
KR20030010429(A) |
申请公布日期 |
2003.02.05 |
申请号 |
KR20010045693 |
申请日期 |
2001.07.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, BYEONG SEON;LEE, TAE JEONG;OH, MYEONG HWAN;PARK, SANG UK;SHIN, MYEONG SEON;YOO, SEUNG HAN |
分类号 |
H01L21/76;H01L21/336;H01L21/762;H01L27/12;H01L29/786;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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