发明名称 |
Gain cell DRAM structure and method of producing the same |
摘要 |
The DRAM cell arrangement has memory cells each having three transistors. The transistors are formed vertically with respect to a y axis (y) which is perpendicular to a surface (O) of a substrate (1). A gate electrode (Ga1) of the first transistor is connected to a source-drain region of the second transistor. A second source-drain (2S/D2) region of the second transistor is connected to a write bit line. A second gate (Ga2) electrode of the second transistor is connected to a write word line (WS). A third gate electrode (Ga3) of the third transistor is connected to a read word line (WA). A second source-drain region (3S/D2) of the first transistor is connected to a first source-drain region of the third transistor. A second source-drain region of the third transistor is connected to a read bit line. The first and second transistors are arranged one above the other with respect to the y axis. Also the first and third transistors are arranged one above the other with respect to the y axis. |
申请公布号 |
EP0917203(A3) |
申请公布日期 |
2003.02.05 |
申请号 |
EP19980119220 |
申请日期 |
1998.10.12 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
KRAUTSCHNEIDER, WOLFGANG, DR.;SCHLOESSER, TILL |
分类号 |
H01L21/8242;H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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