发明名称 Gain cell DRAM structure and method of producing the same
摘要 The DRAM cell arrangement has memory cells each having three transistors. The transistors are formed vertically with respect to a y axis (y) which is perpendicular to a surface (O) of a substrate (1). A gate electrode (Ga1) of the first transistor is connected to a source-drain region of the second transistor. A second source-drain (2S/D2) region of the second transistor is connected to a write bit line. A second gate (Ga2) electrode of the second transistor is connected to a write word line (WS). A third gate electrode (Ga3) of the third transistor is connected to a read word line (WA). A second source-drain region (3S/D2) of the first transistor is connected to a first source-drain region of the third transistor. A second source-drain region of the third transistor is connected to a read bit line. The first and second transistors are arranged one above the other with respect to the y axis. Also the first and third transistors are arranged one above the other with respect to the y axis.
申请公布号 EP0917203(A3) 申请公布日期 2003.02.05
申请号 EP19980119220 申请日期 1998.10.12
申请人 INFINEON TECHNOLOGIES AG 发明人 KRAUTSCHNEIDER, WOLFGANG, DR.;SCHLOESSER, TILL
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
代理机构 代理人
主权项
地址