发明名称 In situ wafer heat for reduced backside contamination
摘要 A method is provided for preparing a substrate for processing in a chamber that has a substrate receiving portion. The substrate is positioned within the chamber in a location not on the substrate receiving portion. A gaseous flow is provided to the chamber, from which a plasma is struck to heat the substrate. After the substrate has been heated, it is moved to the substrate receiving portion for processing.
申请公布号 US6514870(B2) 申请公布日期 2003.02.04
申请号 US20010771085 申请日期 2001.01.26
申请人 APPLIED MATERIALS, INC. 发明人 ROSSMAN KENT
分类号 C23C16/52;C23C14/02;C23C16/02;H01L21/02;H01L21/205;H01L21/302;H01L21/683;(IPC1-7):H01L21/302 主分类号 C23C16/52
代理机构 代理人
主权项
地址