发明名称 |
Method of fabricating abrupt source/drain junctions |
摘要 |
A method of fabricating an integrated circuit forming abrupt source/drain junctions. The process can be utilized for P-channel or N-channel metal oxide field semiconductor effect transistors (MOSFETs) on a silicon-on-insulator (SOI) substrate. The source extension is more conductive than the drain extension. The transistor has reduced short channel effects and strong drive current and yet is reliable.
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申请公布号 |
US6514829(B1) |
申请公布日期 |
2003.02.04 |
申请号 |
US20010803831 |
申请日期 |
2001.03.12 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
YU BIN |
分类号 |
H01L21/265;H01L21/336;H01L29/45;H01L29/786;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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