发明名称 Method of fabricating abrupt source/drain junctions
摘要 A method of fabricating an integrated circuit forming abrupt source/drain junctions. The process can be utilized for P-channel or N-channel metal oxide field semiconductor effect transistors (MOSFETs) on a silicon-on-insulator (SOI) substrate. The source extension is more conductive than the drain extension. The transistor has reduced short channel effects and strong drive current and yet is reliable.
申请公布号 US6514829(B1) 申请公布日期 2003.02.04
申请号 US20010803831 申请日期 2001.03.12
申请人 ADVANCED MICRO DEVICES, INC. 发明人 YU BIN
分类号 H01L21/265;H01L21/336;H01L29/45;H01L29/786;(IPC1-7):H01L21/336 主分类号 H01L21/265
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