DEVICE AND METHOD FOR SUPPORTING TEST

摘要

PROBLEM TO BE SOLVED: To solve problems such as a work to specify where in a machine language instruction an abnormal operation is occurred is difficult since a functional test program is written in terms of binary numbers in failure analysis using an LSI tester. SOLUTION: This device for supporting a test is provided with an extracting means 10 of an address of a nonconformity generating place to extract the address of the nonconformity generating place where instruction fetch is generated based on an instruction fetch signal being sampled by the functional test program and an address bus signal, an extracting part 11 of a comparative error place of an output expected value to extract assembly language description having the same load address as the address of the nonconformity generating place from an assembly list file and a display part 12 of a comparative error place of the output expected value to display the assembly language description so as to be easily specified.