发明名称 WAFER PROCESSING APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To provide a wafer processing apparatus that can control processing liquid atmosphere in a unit effectively. SOLUTION: The wafer processing apparatus for supplying treatment liquid to treat a wafer W is equipped with a support means 57 for supporting the wafer W, an outer chamber 43 for surrounding the support means 57, and a unit chamber 42 for surrounding the outer chamber 43. In the outer and unit chambers 43 and 42, an opening is provided, where the opening can be opened and closed to carry in and carry out the wafer W.</p>
申请公布号 JP2003031537(A) 申请公布日期 2003.01.31
申请号 JP20010215479 申请日期 2001.07.16
申请人 TOKYO ELECTRON LTD 发明人 ORII TAKEHIKO;NISHIDA TATSUYA;KURODA OSAMU
分类号 B08B3/02;H01L21/304;H01L21/68;H01L21/683;(IPC1-7):H01L21/304 主分类号 B08B3/02
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