TEST PATTERN GENERATION CIRCUIT AND GENERATION METHOD FOR BUILT IN SELF TEST CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a pattern generation circuit of a BIST(build in self test) circuit capable of generating a prescribed test pattern in a small area by reducing the number of test pattern generation circuits, and a test pattern generation method for the BIST circuit. SOLUTION: A built in self test circuit generating a test pattern by using a microinstruction code is provided with a storage device RAM/ROM temporarily storing the microinstruction code and outputting two different instruction codes in one clock cycle, a selector SEL receiving the output of the storage device, selectively delaying the two instruction codes and outputting them as one code and a pattern generation circuit PG generating the test pattern corresponding to the output of the selector.