发明名称 High sensitivity common source amplifier MRAM cell, memory array and read/write scheme
摘要 In the present invention, a magnetic random access memory (MRAM) cell includes a magnetic tunnel junction (MTJ) and a transistor. This memory cell provides a boosted output signal between different MTJ states stored. A method that is used by MRAM array for providing larger output voltage signal is also disclosed. The memory may comprise a plurality of such cells which are wired to form XY array. The source of the transistor is coupled to one end of the magnetic tunneling junction, while the drain of the transistor is coupled with an output for reading the magnetic memory cell. Another end of the magnetic tunneling junction is grounded. During reading, a constant voltage is applied to the gate of the transistor in selected memory cell. The drain of the transistor is connected to supply voltage via a load. The transistor functions both as switching element and amplifier to boost the output signal between different MTJ states. Either voltage or current at output can be detected to determine MTJ state.
申请公布号 US6512690(B1) 申请公布日期 2003.01.28
申请号 US20010990425 申请日期 2001.11.21
申请人 READ-RITE CORPORATION 发明人 QI QIUQUN (KEVIN);SHI XIZENG
分类号 G11C11/15;(IPC1-7):G11C11/14 主分类号 G11C11/15
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