发明名称 SAMPLE HOLE DETECTOR FOR PROBE ADHERED TO SUB-LANCE
摘要 PURPOSE: Provided is a sample hole detector for a probe adhered to a sub-lance which detects location of the sample hole in a non-contact way to set its direction so that it helps to reduce malfunction in detection. CONSTITUTION: The sample hole detector for the probe adhered to the sub-lance comprises the parts of: the probe(2) which is adhered to the sub-lance and precipitated in molten steel to detect molten steel sample and the temperature of molten steel; a mark part(12) which is aligned at the rear side of a support pipe(4) for the probe as the same location as the sample hole(3) of the probe; a drive tool which uses a fixed bracket to rotate the probe for detecting the mark part; and a neighboring sensor which is connected to the drive tool.
申请公布号 KR20030006442(A) 申请公布日期 2003.01.23
申请号 KR20010042169 申请日期 2001.07.12
申请人 POSCO;WOOJIN OSK CORPORATION 发明人 BAE, HAE SIK;JUNG, GYEONG UNG;KIM, JIN YEOL;KIM, SEUNG GON;LEE, DONG RYEOL;LEE, GYEONG MOK
分类号 C21C5/46;(IPC1-7):C21C5/46 主分类号 C21C5/46
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