发明名称 Internal clock generating circuit of semiconductor memory device and method thereof
摘要 An internal clock generating circuit and method for generating an internal clock phase-synchronized to an input clock with minimum delay and at high speed is disclosed. An internal clock generating circuit comprises a first delay control circuit for generating a first clock having the time delay of up to T/2 (where T is a cycle of an input clock) from the input clock and for generating a first variable delay control signal; and a second delay control circuit for generating a second clock in response to the first variable delay control signal, the second clock having the time delay of greater than T/2 from the input clock at an initial state and having the time delay of about T from the input clock in a phase-locked state.
申请公布号 US2003016063(A1) 申请公布日期 2003.01.23
申请号 US20020072487 申请日期 2002.02.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK JUNG-WOO;CHO UK-RAE;KIM NAM-SEOG
分类号 G06F1/10;G06F1/06;G11C8/00;H03K5/06;H03K5/135;H03L7/07;H03L7/081;(IPC1-7):H03L7/06 主分类号 G06F1/10
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