发明名称 |
Lithographic projection apparatus, device manufacturing method, device manufactured thereby, and measurement method |
摘要 |
A lithographic projection apparatus includes a first object table configured and arranged to hold a patterning structure capable of patterning a projection beam of radiation according to a desired pattern and a second object table configured and arranged to hold a substrate. A positioning structure is configured and arranged to generate a force so as to move one of the object tables with respect to a projection system during an imaging operation. Processing circuitry is configured and arranged to read from a data storage device a compensation force value that corresponds to a value of a signal representing a position of said object table and to generate a force adjustment signal based on the compensation force value. The positioning structure is further configured and arranged to generate the force according to the force adjustment signal.
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申请公布号 |
US2003016340(A1) |
申请公布日期 |
2003.01.23 |
申请号 |
US20020170227 |
申请日期 |
2002.06.13 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
BUTLER HANS |
分类号 |
G03F7/20;H01L21/027;H02P5/00;(IPC1-7):G03B27/58 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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