发明名称 Lithographic projection apparatus, device manufacturing method, device manufactured thereby, and measurement method
摘要 A lithographic projection apparatus includes a first object table configured and arranged to hold a patterning structure capable of patterning a projection beam of radiation according to a desired pattern and a second object table configured and arranged to hold a substrate. A positioning structure is configured and arranged to generate a force so as to move one of the object tables with respect to a projection system during an imaging operation. Processing circuitry is configured and arranged to read from a data storage device a compensation force value that corresponds to a value of a signal representing a position of said object table and to generate a force adjustment signal based on the compensation force value. The positioning structure is further configured and arranged to generate the force according to the force adjustment signal.
申请公布号 US2003016340(A1) 申请公布日期 2003.01.23
申请号 US20020170227 申请日期 2002.06.13
申请人 ASML NETHERLANDS B.V. 发明人 BUTLER HANS
分类号 G03F7/20;H01L21/027;H02P5/00;(IPC1-7):G03B27/58 主分类号 G03F7/20
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