发明名称 In-situ test for embedded passives
摘要 Methods and apparatus for improved impedance measurements are which allow for shorter delays during recalibration and which eliminate the need to physically disconnect and reconnect test leads after initial calibration has been completed. In particular, an adjustment factor is calculated based on impedances measured during initial calibration and is used to adjust future impedance measurements. Moreover, a plurality of loads having pre-measured impedances are switchably connected to the meter such that re-calibration using said loads may be accomplished without the physical connection or disconnection of test leads. The plurality of loads are preferably incorporated into a test board which also comprises additional test leads and a switching mechanism to alternately connect the various loads and test leads to the meter.
申请公布号 US6510392(B2) 申请公布日期 2003.01.21
申请号 US20000752659 申请日期 2000.12.28
申请人 HONEYWELL ADVANCED CIRCUITS, INC. 发明人 DOI YUTAKA;TISDALE STEPHEN L.
分类号 G01R31/27;(IPC1-7):G01R27/00 主分类号 G01R31/27
代理机构 代理人
主权项
地址