发明名称 Halogen addition for improved adhesion of CVD copper to barrier
摘要 A process is described for depositing a copper film on a substrate surface by chemical vapor deposition of a copper precursor. The process includes treating a diffusion barrier layer surface and/or a deposited film with an adhesion-promoting agent and annealing the copper film to the substrate. Suitable adhesion-promoting agents include, e.g., organic halides, such as methylene chloride, diatomic chlorine, diatomic bromine, diatomic iodine, HCl, HBr and Hl. Processes of the invention provide copper-based films, wherein a texture of the copper-based films is predominantly (111). Such films provide substrates having enhanced adhesion between the diffusion barrier layer underlying the (111) film and the copper overlying the (111) film.
申请公布号 US6509266(B1) 申请公布日期 2003.01.21
申请号 US20010824455 申请日期 2001.04.02
申请人 AIR PRODUCTS AND CHEMICALS, INC. 发明人 CIOTTI RALPH J.;BECK SCOTT EDWARD;KARWACKI, JR. EUGENE JOSEPH
分类号 H01L21/285;H01L21/768;(IPC1-7):H01L21/44 主分类号 H01L21/285
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