发明名称 Technique of controlling noise of power supply in semiconductor memory device
摘要 A semiconductor memory device includes: at least one memory cell block including multiple dynamic memory cells arrayed in a matrix; a row address decoder and a column address decoder that select a memory cell in the memory cell block, which is specified by an address including a row address and a column address; an output buffer that causes data to be output from the selected memory cell specified by the address; a preset circuit that presets an output level of the output buffer; and a preset control module that controls an operation of the preset circuit. At every time of outputting data from the memory cell selected by the column address decoder, the output level of the output buffer is preset, prior to output of the data from the selected memory cell by means of the output buffer. This arrangement effectively prevents the potential noise in a power source of the semiconductor memory device.
申请公布号 US2003012060(A1) 申请公布日期 2003.01.16
申请号 US20020119841 申请日期 2002.04.11
申请人 SEIKO EPSON CORPORATION 发明人 MIZUGAKI KOICHI
分类号 G11C11/403;G11C11/401;G11C11/406;G11C11/407;G11C11/4074;G11C11/409;(IPC1-7):G11C29/00 主分类号 G11C11/403
代理机构 代理人
主权项
地址