| 摘要 |
PROBLEM TO BE SOLVED: To realize an IC test apparatus in which a fail in a proper amount can be stored. SOLUTION: The IC test apparatus improves an IC test apparatus wherein a test pattern is given to a specimen on the basis of a pattern address, the judgment of a pass or the fail is performed on the basis of the compared value of the output of the specimen with an expected value, and, when the fail is judged, a fail memory stores at least the pattern address on the basis of the judgment of the pass or the fail. The apparatus comprises a fail mask wherein the judgment of the pass or the fail is input, the fail is counted, the fail is limited when the fail is in the prescribed number of times, and the judgment of the pass or the fail is output when the fail is not in the prescribed number of times.
|
