发明名称 CI SOCKET FOR TEST
摘要 PROBLEM TO BE SOLVED: To provide an IC socket wherein a mechanism to elastically receive an IC package is simplified and the performance to elastically receive it is enhanced when the IC package is thrown in. SOLUTION: Three sets or more of elastically supporting pin mechanisms 14 composed of a stepped pin 15 and a coil spring 16 to drive this stepped pin 15 upward are installed at a socket base structure 5 of the IC socket 1, and constituted so that the IC package 2 will be received by these elastically supporting pin mechanisms 14. In a state that the IC package 2 is conveyed by a handler and elastically supported by the stepped pins 15 of the three sets of the elastically supporting pin mechanisms 14, the IC package 2 is pushed downward and lead terminal 3 is brought into contact with a contact blade 13.
申请公布号 JP2003007409(A) 申请公布日期 2003.01.10
申请号 JP20010189463 申请日期 2001.06.22
申请人 SUNCALL CORP 发明人 MITAKE KENICHI;UCHIYAMA NOBUAKI
分类号 G01R31/26;G01R1/073;H01R33/76;(IPC1-7):H01R33/76 主分类号 G01R31/26
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