发明名称 |
POLY SILICON-GERMANIUM GATE ELECTRODE AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: A poly Si-Ge gate electrode and a method for fabricating the same are provided to prevent roughness of a surface by forming an amorphous silicon buffer layer under a poly Si-Ge layer and improve a characteristic of salicide by forming an amorphous silicon layer on the poly Si-Ge layer. CONSTITUTION: A gate oxide layer(20) is formed on an upper portion of a semiconductor substrate(10). An amorphous silicon buffer layer(30) is formed on an upper portion of a gate oxide layer(20). A poly SiGe layer(40) is formed on an upper portion of the amorphous silicon buffer layer(30). An amorphous silicon layer(50) is formed on an upper portion of the poly SiGe layer(40). A gate electrode is formed by patterning and etching a gate electrode pattern.
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申请公布号 |
KR20030003380(A) |
申请公布日期 |
2003.01.10 |
申请号 |
KR20010039117 |
申请日期 |
2001.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHA, HAN SEOP |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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