发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To overcome a problem that the periphery of an element region becomes concave by repetition of thermal oxidation and etching processes in an integrated circuit device which includes flash memories and corresponds to multiple supply voltages. SOLUTION: In the thermal oxidation process of an element region, enlargements of thermal oxidation films in the other element regions can be suppressed by covering the other element regions with an oxidation resistance film. |
申请公布号 |
JP2003007863(A) |
申请公布日期 |
2003.01.10 |
申请号 |
JP20010188186 |
申请日期 |
2001.06.21 |
申请人 |
FUJITSU LTD |
发明人 |
HASHIMOTO KOJI;TAKAHASHI KOJI |
分类号 |
H01L21/8234;H01L21/8239;H01L21/8247;H01L27/088;H01L27/10;H01L27/105;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L21/824;H01L21/823 |
主分类号 |
H01L21/8234 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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