| 摘要 |
<p>In a device (1), which is preferably a test device (1), there are provided data generating means (5) for generating device identification data (DIDA) significant with regard to the device (1) itself, which device identification data (DIDA) may be fed to an integrated circuit (2) introduced into the device (1), the integrated circuit (2) comprising a memory (12), with a memory area (13) which is provided and designed to store the device identification data (DIDA)</p> |
