发明名称 |
Ferroelectric memory device, e.g. ferroelectric random-access memories comprises bottom electrode patterns formed on semiconductor substrate, and first and second ferroelectric layers |
摘要 |
<p>A ferroelectric memory device has bottom electrode patterns formed on a semiconductor substrate, first ferroelectric layer on the substrate and disposed between the electrode patterns, and second ferroelectric layer formed on a top surface of the electrode pattern and a top surface of the first layer. An independent claim is also included for a method of fabricating the ferroelectric memory device.</p> |
申请公布号 |
DE10227346(A1) |
申请公布日期 |
2003.01.09 |
申请号 |
DE2002127346 |
申请日期 |
2002.06.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, KYU-MANN |
分类号 |
H01L27/105;H01L21/02;H01L21/3105;H01L21/316;H01L21/321;H01L21/8246;H01L27/115;(IPC1-7):H01L27/105;H01L21/823 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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