摘要 |
A panel tester and grader includes a main frame including a plurality of rollers and defining a substantially S-shaped testing path. A substantially linear bypass path extends below the testing path and a bypass assembly is coupled to the main frame and is operable to move the main frame between a testing position in which panels are received by the testing path, and a bypass position in which panels are received by the bypass path. A load cell providing a load output is coupled to a deflector roller to measure a load applied to the panel by the deflector roller. The load output is monitored as the panels are guided through the panel tester and the load output is selectively recorded based upon the monitored load output.
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