发明名称 Read circuit of nonvolatile semiconductor memory
摘要 An INVSRC node and a SAREF node are previously precharged. After a potential on a bit line is reset, the bit line (BLS node) is precharged. In this event, a clamp MOS transistor in a sense amplifier is in ON state, and an SA node is also precharged simultaneously. A precharge level is set to a value lower than a threshold voltage of an inverter. Subsequently, when SAEN transitions to "H," a sense operation is performed. For reading data "0," the SA node is rapidly increased to Vdd. For reading data "1," the SA node slowly approaches to Vss. A change in the potential at the SA node is detected by the inverter.
申请公布号 US2002196667(A1) 申请公布日期 2002.12.26
申请号 US20020188148 申请日期 2002.07.03
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 IKEHASHI TAMIO;IMAMIYA KENICHI;NODA JUNICHIRO
分类号 G11C16/06;G11C7/06;G11C8/02;G11C16/28;(IPC1-7):G11C11/34 主分类号 G11C16/06
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