| 摘要 |
The present invention provides a probe unit in which satisfactory resilient shifting action of a lead portion supporting a conductive bump and a supplementary pressure imparting resilient body is realized, and a wiping action is taken place between the conductive bump and an external contact, thereby soundly press-contacting the conductive bump with respect to the external contact. A press-contact structure of a probe unit comprises an insulative film 1 with a plurality of leads 2 arranged in array on a surface thereof, a press-contact conductive bump 3 formed on one end of each lead 2, and a cantilever inclination end portion 7 formed by pushing up one end of each lead 2 and one end of the insulative film 1, where one end of the lead 2 is disposed, by a supplementary pressure imparting resilient body 4, the conductive bump 3 being backed up on the cantilever inclination end portion 7 with the supplementary pressure imparting resilient body 4, the cantilever inclination end portion 7 being shifted in a direction for reducing the inclination angle while compressing the supplementary pressure imparting resilient body 4, when the conductive bump 4 is press-contacted with an external contact of an electronic part, a press-contacting force of the conductive bump 3 with respect to the external contact being obtained by a restoring force of the supplementary pressure imparting resilient body 4.
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