发明名称 Apparatus and method relating to charged particles
摘要 The present invention provides an apparatus for acting upon charge particles in dependence upon on or more parameters including mass and/or energy and/or charged state of the particles. The apparatus includes an array of elongate magnetic poles extending longitudinally in an elongation direction of the array; an array reference surface extending in the array elongation direction and passing through the array with a magnetic pole on each side of the reference surface; a means for providing charged particles entering into or originating in the field of the magnetic pole array. The magnetic poles are configured in a plane perpendicular to the elongation direction to give parameter dependent change of direction to charged particles moving in array with a direction of movement substantially parallel to the reference surface, whereby parameter dependent selection of charged particles may be achieved by parameter dependent dispersion in a plane transverse to the reference surface.
申请公布号 US6498348(B2) 申请公布日期 2002.12.24
申请号 US20000736253 申请日期 2000.12.15
申请人 SUPERION LIMITED 发明人 AITKEN DEREK
分类号 H01J37/317;H01J49/20;H01J49/30;H01J49/32;(IPC1-7):H01J49/00 主分类号 H01J37/317
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