发明名称 Apparatus and method for controlling plasma uniformity across a substrate
摘要 A magnetron source comprises a hollow cathode with a non-planar target. By using a magnet between the cathode and a substrate, plasma can be controlled to achieve high ionization levels, good step coverage, and good process uniformity. Step coverage uniformity is also improved by controlling the magnetic fields, and thus the flow of ions and electrons, near the plane of the substrate.
申请公布号 US6497796(B1) 申请公布日期 2002.12.24
申请号 US20000653611 申请日期 2000.08.31
申请人 NOVELLUS SYSTEMS, INC. 发明人 ASHTIANI KAIHAN A.;LEVY KARL B.;LAI KWOK F.;NORDQUIST ANDREW L.;HARTSOUGH LARRY D.
分类号 H01J37/34;(IPC1-7):C23C14/35 主分类号 H01J37/34
代理机构 代理人
主权项
地址