| 摘要 |
PROBLEM TO BE SOLVED: To shorten a time required for a test by widening an application range of a parallel test. SOLUTION: In a semiconductor memory provided with memory cell sections (5-A, 5-B), the device is provided with column control means (1-4) activating simultaneously a plurality of columns retracted by shrinking and replaced in a column redundancy replacement, and data read-out means (6-A, 6-B, SDBP-B0, SDBP-B1, 9) reading out simultaneously data from a plurality of memory cells selected by the plurality of columns.
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