发明名称 |
Nonvolatile semiconductor memory device and manufacturing method thereof |
摘要 |
In a channel region between the source/drain diffusion layers, impurities of the same conductivity type as the well are doped in an area apart from the diffusion regions. By using as a mask the gate formed in advance, tilted ion implantation in opposite directions is performed to form the diffusion layers and heavily impurity doped region of the same conductivity type as the well in a self-alignment manner relative to the gate.
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申请公布号 |
US2002190306(A1) |
申请公布日期 |
2002.12.19 |
申请号 |
US20020166145 |
申请日期 |
2002.06.11 |
申请人 |
HITACHI, LTD. |
发明人 |
SASAGO YOSHITAKA;KOBAYASHI TAKASHI |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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