发明名称 METHODS AND APPARATUS FOR ANALYZING AND REPAIRING MEMORY
摘要 Methods and apparatus for analyzing and repairing memory are presented. The method includes the step (302,304,306) of determining if failed memory cells detected in at least a portion of memory must be repaired using only one of a number of types of memory spares or may be repaired using any of the types of memory spares. Failed memory cells that must be repaired using only one of the number of types of memory spares are repeatedly repaired (308) skipping any failed memory cells that may be repaired using any of the number of types of memory spares, until either no new errors that must be repaired are repaired and no failed memory cells are skipped or memory is determined to not be repairable.
申请公布号 WO02101749(A1) 申请公布日期 2002.12.19
申请号 WO2002US17744 申请日期 2002.06.07
申请人 MITSUBISHI ELECTRIC CORPORATION;SAUVAGEAU, ANTHONY, J.;MULLINS, MICHAEL, A. 发明人 SAUVAGEAU, ANTHONY, J.;MULLINS, MICHAEL, A.
分类号 G11C29/44;G11C29/00;G11C29/04;(IPC1-7):G11C7/00;G11C8/00 主分类号 G11C29/44
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