发明名称 AN INTERMEDIATE MANUFACTURE FOR A DUAL GATE LOGIC DEVICE
摘要 The present invention features double-or dual-gate logic devices that contain gate conductors that are consistently self-aligned and that have channels that are of constant width. The inventive process also provides a method of selectively etching germanium-containing gate conductor materials without significantly etching the adjacent silicon channel material. In this manner, the gate conductor can be encased in a dielectric shell without changing the length of the silicon channel. A single-crystal silicon wafer is utilized as the channel material. Pillars or stacks of self aligned dual gate MOSFETs are generated by etching, via the juxtaposition of overlapping germanium-containing gate conductor regions. Vertically etching through regions of both gate conducting material and dielectric insulating material provides an essentially perfect, self-aligned dual gate stack. A process is described wherein the gate conductor material can be selectively etched without etching the channel material.
申请公布号 WO02101834(A2) 申请公布日期 2002.12.19
申请号 WO2002GB02622 申请日期 2002.05.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;IBM UNITED KINGDOM LIMITED 发明人 FURUKAWA, TOSHIHARU;HAKEY, MARK;HOLMES, STEVEN;HORAK, DAVID;MA, WILLIAM
分类号 H01L21/76;H01L21/02;H01L21/28;H01L21/336;H01L21/762;H01L21/8234;H01L27/08;H01L27/088;H01L27/12;H01L29/78;H01L29/786 主分类号 H01L21/76
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