发明名称 Contact and via fabrication technologies
摘要 A method of forming a contact opening between two conductive features over a semiconductor substrate. Oxide spacers are formed adjacent to the conductive features. A doped oxide layer is then deposited over the semiconductor substrate. Finally, the contact opening is etched through the doped oxide layer between the conductive features such that the oxide spacers are exposed within the contact opening.
申请公布号 US6495470(B2) 申请公布日期 2002.12.17
申请号 US19950580532 申请日期 1995.12.29
申请人 INTEL CORPORATION 发明人 SADJADI S. M. REZA;MOINPOUR MANSOUR;LIN TE HUA;MOGHADAM FARHAD K.
分类号 H01L21/768;H01L23/522;(IPC1-7):H01L21/461 主分类号 H01L21/768
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