发明名称 METHOD FOR TESTING ELECTRONIC COMPONENTS
摘要 The invention features a device (1) comprising processing means (13) capable of controlling test equipment (2) to carry out repeatedly some at least of i ts steps, each time reducing the duration of at least one of them until satisfying a final criterion taking into account the distribution of the electric variables measured by the said equipment for each reduced duration value, and to set a new duration value at most equal to its initial value, f or which the measured electric variable distribution satisfies one selected dispersion condition. It further comprises a function generator (14), capabl e of providing a function applicable to at least one of the terms of a comparison executed during one of the said steps, so that the said function operates on a measurement executed after the new duration.
申请公布号 CA2256601(C) 申请公布日期 2002.12.10
申请号 CA19972256601 申请日期 1997.05.23
申请人 SOFTLINK 发明人 LEJEUNE, PHILIPPE
分类号 G01R31/26;G01R31/28;G01R31/30;G01R31/317;G01R35/04;H01L21/66;(IPC1-7):G01R31/01 主分类号 G01R31/26
代理机构 代理人
主权项
地址