发明名称 |
Cell-based noise characterization and evaluation |
摘要 |
In deep submicron technologies, coupling capacitance significantly dominates the total parasitic capacitance. This causes crosstalk noise to be induced on quiescent signals which could lead to catastrophic failures. A methodology is provided that is a practical approach to full-chip crosstalk noise verification. A multi-dimensional noise lookup table is formed for a cell used within the IC, wherein the multi-dimensional noise table relates a set of input noise pulse characteristics and a set of output loading characteristics to an output noise pulse characteristic of the cell. A noise pulse on an input to an instantiation of a cell is determined and then characterized. An output loading characteristic of the cell is also made. A prediction of whether the instantiation of cell will propagate the noise pulse is made by selecting an output noise pulse characteristic from the multi-dimensional noise table corresponding to the noise pulse characteristic and to the output loading characteristic. Other instantiations of the cell are evaluated using the same multi-dimensional noise table. A prediction of whether each instantiation of cell will propagate the noise pulse is made by selecting an output noise pulse characteristic from the multi-dimensional noise table corresponding to the noise pulse characteristic and to the output loading characteristic associated with each instantiation of the cell.
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申请公布号 |
US6493853(B1) |
申请公布日期 |
2002.12.10 |
申请号 |
US20000617575 |
申请日期 |
2000.07.17 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
SAVITHRI NAGARAJ N.;APOSTOL JOHN;HILL ANTHONY M. |
分类号 |
G06F17/50;(IPC1-7):G06F9/45 |
主分类号 |
G06F17/50 |
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