发明名称 ELECTRIC-POWER CAPACITY SETTING METHOD, POWER SUPPLY DEVICE, AND POWER SUPPLY DEVICE FOR SEMICONDUCTOR-DEVICE TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an electric-power capacity setting method, which makes it possible to set power capacity of a power feed device the capacity without waste, in a power feed device supplying DC power to a number of loads. SOLUTION: In a power supply device, which is constituted of a plurality of programmable DC power supply units, with which current can be freely outputted according to the request from the loads within the range of the permissible current determined by the set maximum current; and the power feed device, which can safely feed power of the total volume of current that the plurality of programmable DC power supply units request, the maximum current, set with each of the programmable DC power supply units, is set corresponding to the rated maximum current determined to each load; and the power capacity of the power feed device is determined according to the value of the total volume of the set rated maximum currents of the loads.
申请公布号 JP2002354664(A) 申请公布日期 2002.12.06
申请号 JP20010153370 申请日期 2001.05.23
申请人 ADVANTEST CORP 发明人 SEKI SHINSUKE
分类号 G01R31/28;H02J1/10 主分类号 G01R31/28
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