发明名称 MOS field effect transistor structure and method of manufacture
摘要 A method of manufacturing a metal-oxide-semiconductor field effect (MOSFET) device. A substrate having an isolating structure thereon is provided. A gate dielectric layer and a conductive layer are sequentially formed over the substrate. The conductive layer and the gate dielectric layer are patterned to form a gate structure. A low dielectric constant material spacer is formed on the sidewall of the gate structure. A source drain region is formed in the substrate on each side of the gate structure.
申请公布号 US2002179982(A1) 申请公布日期 2002.12.05
申请号 US20010867327 申请日期 2001.05.29
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHENG SHUI-MING;CHENG YAO-CHIN;HUANG YU-SHYANG;LIU CHIH-CHIEN
分类号 H01L21/336;H01L29/78;(IPC1-7):H01L31/062 主分类号 H01L21/336
代理机构 代理人
主权项
地址