| 摘要 |
The device has at least one integrated main circuit (12) on a semiconducting substrate (10) and at least one integrated auxiliary circuit (16) on the substrate for outputting and/or receiving electrical signals to or from the main circuit and arranged in a separate region of the substrate. Each circuit has at least one contact device (26,32) externally contactable to make at least one temporary signal connection between main, auxiliary circuits. AN Independent claim is also included for the following: a method of operating, especially testing, a main circuit of a semiconducting device. |
