发明名称 |
Apparatus for determining the crystalline and polycrystalline materials of an item |
摘要 |
A diffraction apparatus (10) for determining crystalline and polycrystalline materials of an item in objects, preferably in luggage, having a collimation/detector arrangement (11) and an X-ray source (12) and which is mounted to be adjustable in an X-ray testing machine (13). The collimation/detector arrangement (13)is adjustable in height relative to the X-ray source (12), and the two are also laterally and synchronously adjustable via respective adjustment elements (5,6). The collimator (13) has a conically-expanding round slot (15), which simulates a predetermined angle (THETAM) of a scatter-beam path.
|
申请公布号 |
US2002181656(A1) |
申请公布日期 |
2002.12.05 |
申请号 |
US20010080762 |
申请日期 |
2001.05.16 |
申请人 |
RIES HERMANN;SCHALL PATRICIA;CORDES FRANK;HARTICK MARTIN |
发明人 |
RIES HERMANN;SCHALL PATRICIA;CORDES FRANK;HARTICK MARTIN |
分类号 |
G01N23/20;G21K5/04;(IPC1-7):G21K1/02 |
主分类号 |
G01N23/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|