发明名称 Apparatus for determining the crystalline and polycrystalline materials of an item
摘要 A diffraction apparatus (10) for determining crystalline and polycrystalline materials of an item in objects, preferably in luggage, having a collimation/detector arrangement (11) and an X-ray source (12) and which is mounted to be adjustable in an X-ray testing machine (13). The collimation/detector arrangement (13)is adjustable in height relative to the X-ray source (12), and the two are also laterally and synchronously adjustable via respective adjustment elements (5,6). The collimator (13) has a conically-expanding round slot (15), which simulates a predetermined angle (THETAM) of a scatter-beam path.
申请公布号 US2002181656(A1) 申请公布日期 2002.12.05
申请号 US20010080762 申请日期 2001.05.16
申请人 RIES HERMANN;SCHALL PATRICIA;CORDES FRANK;HARTICK MARTIN 发明人 RIES HERMANN;SCHALL PATRICIA;CORDES FRANK;HARTICK MARTIN
分类号 G01N23/20;G21K5/04;(IPC1-7):G21K1/02 主分类号 G01N23/20
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