发明名称 Channel-erase nonvolatile semiconductor memory device
摘要 In a channel-erase EEPROM, there is a parasitic capacitance between node N1 to which a substrate voltage is supplied and node N2 to which the voltage on a word line is supplied. A negative voltage is applied to the word line in erasing the data in a memory cell. A switch circuit SW1 is connected between node N1 and node N2. Between node N1 and the ground, a switch SW4 is connected. A switch SW5 is connected between node N2 and the ground. When the erase operation has been completed, the switch circuit SW1 is first turned on, short-circuiting node N1 and node N2. Thereafter, the switch circuits SW4, SW5 are turned on, grounding node N1 and node N2 separately.
申请公布号 US2002181313(A1) 申请公布日期 2002.12.05
申请号 US20020197847 申请日期 2002.07.19
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 ATSUMI SHIGERU;TAURA TADAYUKI;TANZAWA TORU
分类号 G11C16/02;G11C16/00;G11C16/16;(IPC1-7):G11C8/00 主分类号 G11C16/02
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