发明名称 PHASE SHIFT MASK AND ITS DESIGN METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a phase shift mask in which time necessary for the setting of a halftone region is shortened and its manufacturing is facilitated. SOLUTION: After placing a plurality of main patterns 1a and 1b by a predetermined pitch P, virtual regions 2a and 2b are formed by enlarging each of the main patterns 1a and 1b by a predetermined resizing amountΔ. When the virtual regions 2a and 2b have an overlapped region 3, the overlapped region 3 is set as a halftone region forming part which is placed between the virtual regions 2a and 2b and has predetermined transmittance T to exposure light. The resizing amountΔand the transmittance T are set so that a transfer size on the predetermined resist film of the main patterns 1a and 1b under predetermined exposure conditions falls within a desired range according to the change of the pitch P.</p>
申请公布号 JP2002351046(A) 申请公布日期 2002.12.04
申请号 JP20010154994 申请日期 2001.05.24
申请人 NEC CORP 发明人 TANAKA SATSUKI
分类号 G03F1/29;G03F1/32;G03F1/36;G03F1/68;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/29
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