发明名称 High speed pass through test system and test method for electronic modules
摘要 A pass through test system for testing an electronic module includes an interface board, and metal fret test contactors configured to electrically engage terminal contacts on the module. The test contactors and interface board are mounted to an automated or manual pass through test handler configured to allow electrical engagement of the module with a zero insertion force. The interface board includes interface contacts configured to engage the test contactors at intermediate points along their lengths, and to shorten the electrical paths through the test contactors. The interface contacts are in electrical communication with high speed conductors on the interface board, and can be constructed of a conductive polymer material, or alternately as metal frets. During a test method the module is supported edge to edge and generally parallel to the interface board. In an alternate embodiment the test contactors are metal frets configured to simultaneously electrically engage the terminal contacts on the module and planar interface contacts on the interface board. The test method includes the steps of: providing the movable test contactors, electrically engaging the terminal contacts on the module and the interface contacts on the interface board using the test contactors, and then applying test signals through the test contactors and the terminal contacts to the modules.
申请公布号 US6489794(B1) 申请公布日期 2002.12.03
申请号 US20000653148 申请日期 2000.08.31
申请人 MICRON TECHNOLOGY, INC. 发明人 CRAM DANIEL P.
分类号 G01R1/073;(IPC1-7):G01R1/073;G01R31/02 主分类号 G01R1/073
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