发明名称 Apparatus for depositing layers having atomic thickness on a substrate used in the semiconductor industry has a chamber wall arranged between two chamber regions to separate the chamber regions
摘要 Apparatus for depositing layers having atomic thickness on a substrate comprises a chamber with a first chamber region in which a first layer is deposited on a substrate, a second chamber region in which a second layer is deposited on the first layer and a transport system for transporting the substrate. The first and second chamber regions are separated by a chamber wall. Apparatus for depositing layers having atomic thickness on a substrate (5) comprises a chamber (10) with a first chamber region (15), into which a first process gas (20) is introduced to deposit a first layer (25) on the substrate, and a second chamber region (30), into which a second process gas (35) is introduced to deposit a second layer (40) on the first layer; and a transport system (45) to transport the substrates. A chamber wall (55) is arranged between the first chamber region and the second chamber region to separate the chamber regions. An Independent claim is also included for a process for depositing layers having atomic thickness on a substrate. Preferred Features: The chamber wall has a recess so that a substrate can pass through the chamber wall. A third chamber region (65) is arranged between the first chamber region and the second chamber region to separate the first and second chamber regions.
申请公布号 DE10141084(A1) 申请公布日期 2002.11.28
申请号 DE20011041084 申请日期 2001.08.22
申请人 INFINEON TECHNOLOGIES AG 发明人 HECHT, THOMAS;GUTSCHE, MARTIN;SEIDL, HARALD;LEONHARDT, MATTHIAS
分类号 C23C16/44;C23C16/455;C23C16/458;C23C16/54;(IPC1-7):C23C16/54 主分类号 C23C16/44
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