发明名称 THIN FILM TRANSISTOR ARRAY SUBSTRATE
摘要 <p>PROBLEM TO BE SOLVED: To provide a TFT(thin film transistor) array substrate in which the short circuit failure between adjacent wirings or the like can be recognized in the defect inspecting process of the TFT array substrate and, moreover, a correct inspected result can be obtained when a GS(group separator) short circuit failure is caused. SOLUTION: Gate wirings 5 and source wirings 6 exist by being prolonged in each TFT array chip of the four TFT array chips formed on a sheet of a TFT array substrate 1. The gate wirings 5 are connected alternately to two lines of wirings for evaluating a picture 9a. A plurality of source wirings 6 are connected to a line of three lines of wirings for evaluating a picture 9b in order. Moreover, two lines of short circuit bars for gate wiring 3a and three lines of short circuit bars for source wiring 3b which exit by being prolonged in the outside of a TFT array chip wiring area are connected respectively to a line of corresponding wirings for evaluating a picture 9a of the side of the gate wirings and wirings for evaluating a picture 9b of the side of the source wirings.</p>
申请公布号 JP2002341377(A) 申请公布日期 2002.11.27
申请号 JP20010145606 申请日期 2001.05.15
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 UNO MITSUHIRO;HARADA KAZUYUKI;TABATA SHIGERU;SEKADO YASUTO
分类号 G02F1/1368;H01L21/3205;H01L23/52;H01L29/786;(IPC1-7):G02F1/136;H01L21/320 主分类号 G02F1/1368
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