SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS TEST METHOD

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit and its test method which can increase a toggle rate of an internal circuit without increasing manufacturing cost in a burn-in test, and improve easily stress coverage. SOLUTION: The test method includes a first step for performing a burn-in test by operating a microcomputer by executing a program stored in a ROM, and a second step for performing a burn-in test by using scan which is executed by a scan chain with a scan cell. Both the first step and the second step are executed in one burn-in test by switching the first step and the second step.