发明名称 Radiation inspection apparatus and radiation inspection method
摘要 A radiation inspection apparatus calculates the difference between pixel data of each pixel, which is outputted from radiation detector 3, and pixel data of each of surrounding pixels thereof. Then, the apparatus obtains a total of circumference length of an object to be inspected WA by totalizing the number of pixels, the gray level data obtained by difference processing correspondingly to each of which is within a predetermined gray level range of gray level profile from XL to XH. Thus, the apparatus determines from the value of the total of the circumference length of the object whether or not a crack or a nick occurs in the object.
申请公布号 AU3434202(A) 申请公布日期 2002.11.21
申请号 AU20020034342 申请日期 2002.04.16
申请人 SHIMADZU CORPORATION 发明人 RYOICHI SAWADA
分类号 G01B15/00;G01B15/04;G01N23/04;G01N23/10;G01T1/00;G06T1/00;G06T7/60 主分类号 G01B15/00
代理机构 代理人
主权项
地址