发明名称 Method for manufacturing compound semiconductor device
摘要 In manufacturing compound semiconductor device, a plasma treatment is carried out by exposing surface of compound semiconductor material including AlAs or InAs exposing in atmosphere at manufacturing process in plasma of gas including any of P, N, H, and Ar at substrate temperature of less than 200° C. Desirably a second plasma treatment is carried out by exposing said compound semiconductor material in plasma of gas including p at higher substrate temperature continuously after said plasma treatment without taking the substrate out in air.
申请公布号 US6482720(B2) 申请公布日期 2002.11.19
申请号 US20010842319 申请日期 2001.04.26
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 SUGINO TAKASHI;NAKAJIMA SHIGERU
分类号 H01L29/73;H01L21/306;H01L21/324;H01L21/331;H01L21/335;H01L21/338;H01L29/205;H01L29/778;H01L29/812;(IPC1-7):H01L21/322 主分类号 H01L29/73
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