发明名称 |
AUTOMATIC TEST CLOCK SELECTION APPARATUS |
摘要 |
An integrated circuit (100) includes circuitry for generating a clock signal (CLOCK) during both a normal mode of operation and a test mode of operation. During the normal mode, an input clock signal is delayed via a skew corrector (135). In test mode, an input test clock signal (TEST CLOCK) bypasses the skew corrector (135) via a clock signal source selector (150). The clock signal source selector (150) is controlled automatically by a mode detector (140) that responds to the input clock signals to determine the mode of operation of the integrated circuit (100). <IMAGE> |
申请公布号 |
SG92594(A1) |
申请公布日期 |
2002.11.19 |
申请号 |
SG19960002538 |
申请日期 |
1993.11.02 |
申请人 |
THOMSON CONSUMER ELECTRONICS, INC. |
发明人 |
ALBEAN DAVID LAWRENCE;GYUREK JOHN WILLIAM;DUNCAN CHRISTOPHER DALE |
分类号 |
G01R31/28;G01R31/30;G01R31/317;G01R31/3183;G01R31/319;H03K5/26;(IPC1-7):H03K5/22 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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