发明名称
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for crystallization of a semiconductor film by which a throughput and the degree of crystallization can be enhanced and also provide a method for manufacturing an active matrix substrate using the semiconductor film. SOLUTION: In an annealing process for crystallizing an amorphous silicon film 30 formed on the surface of a substrate 20, laser light LA is cast on the silicon film 30. An arc lamp 91 and a reflector 92, which are used for rapid heat treatment, are directed toward the laser light LA-cast region of the silicon film 30. At that time, the region cast by the lamp light LC emitted by the arc lamp 91 and the laser light LA-cast region should overlap each other. Under this condition, the silicon film 30 is annealed with the substrate 20 being moved in the direction shown by an arrow Y1.</p>
申请公布号 JP3346145(B2) 申请公布日期 2002.11.18
申请号 JP19960004361 申请日期 1996.01.12
申请人 发明人
分类号 G02F1/136;G02F1/1368;H01L21/02;H01L21/20;H01L21/26;H01L21/268;H01L21/336;H01L27/12;H01L29/786;(IPC1-7):H01L21/20 主分类号 G02F1/136
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