发明名称 VISUAL EXAMINATION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a compact visual examination apparatus that can pick up the images of circumferential and upper surfaces of an object by one camera nearly in the same size, and has excellent installation properties. SOLUTION: The camera 1 is installed for picking up the image of the upper surface Wb of the object, and a convex lens 2 is installed between the camera 1 and the object W. In an examination image that is picked up by the camera 1 via the convex lens 2, the images are projected continuously with the upper surface of the object W as a center. In this case, the image at circumferential- surface upper section is projected onto the outside, furthermore, the image at a circumferential-surface center section is projected to the outside, and, additionally, the image at the circumferential-surface lower section is projected continuously to the outside. The diameter of the convex lens 2 is set three times larger than the external diameter of the object W, thus obtaining the examination image where the image of a peripheral surface Wa in the convex lens 2 and that of the upper surface are nearly the same. In addition, a general image-pickup lens can be used for the camera.
申请公布号 JP2002323456(A) 申请公布日期 2002.11.08
申请号 JP20010130635 申请日期 2001.04.27
申请人 NIDEC TOSOK CORP;KOA RABO:KK 发明人 YOSHIKAWA YUKIO;NOSO KAZUNORI
分类号 G01B11/30;G01N21/90;(IPC1-7):G01N21/90 主分类号 G01B11/30
代理机构 代理人
主权项
地址