发明名称 PACKAGING OF INTEGRATED CIRCUITS AND VERTICAL INTEGRATION
摘要 <p>A first level packaging wafer (110) is made of a semiconductor or insulating material. The bumps (150B) on the wafer (110) are made using vertical integration technology, without solder or electroplating. More particularly, vias (160) are etched part way into a first surface of the substrate (140). Metal (150) is deposited into the vias (160). Then the substrate (140) is blanket-etched from the back side (110B) until the metal (150) is exposed and protrudes from the vias (160) to form suitable bumps (150B). Dicing methods and vertical integration methods are also provided. Solder or electroplating are used in some embodiments.</p>
申请公布号 WO0141207(A9) 申请公布日期 2002.11.07
申请号 WO2000US33073 申请日期 2000.12.06
申请人 TRUSI TECHNOLOGIES, LLC 发明人 SINIAGUINE, OLEG;SAVASTIOUK, SERGEY
分类号 H01L21/60;H01L21/68;H01L21/768;H01L23/48;H01L23/485;H01L25/065;(IPC1-7):H01L21/44;H01L21/48;H01L21/331 主分类号 H01L21/60
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